SpotOn位敏探测系统

SpotOn位敏探测系统 H`JFXM
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新势力光电供应SpotOn位敏探测系统，光谱范围350-1100nm 、位置精度±0.1um或者光束尺寸±0.025%。该系列位敏探测系统用于测量：激光中心/位移/功率的测量、光学系统准直及品质控制、旋转及位移的测量、平面度及准直性的校准、振动及缺陷的监控。 }e[ E  
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Model	Descriptions
SPOTUSB-L	Lateral effect PnP 9mm×9mm, no glass cover
SPOTUSB-N	Lateral effect PnP 10mm×10mm, with glass cover
SPOTUSB-Q	Four quadrant PnP 10mm×10mm, with 30um gap, no glass cover
SPOTUSB-U	Four quadrant PnP 10mm×10mm, with 10um gap, with glass cover
SPOTON-LA	Large aperture, 135mm×100mm, 400-800nm
Optional heads
L44	Lateral effect PnP, usable beam size<25mm
L18	Lateral effect PnP 18mm×18mm, with glass cover
L4	Lateral effect PnP 4mm×4mm, no glass cover
Optional accessories
NG4	ND filter in housing (3/4"-32 thread)
NG9	ND filter in housing (3/4"-32 thread)
NG10	ND filter in housing (3/4"-32 thread)
Hood	55mm long, for ambient light suppression

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