[求助]要如何使用倾斜的detector看到不同周期的干涉条纹 [复制链接]

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要如何使用倾斜的detector看到不同周期的干涉条纹 Fl>]&x*~  
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这边有一个Michelson Interferometer, nws"RcP+Z  
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我试着调整DETECTOR的角度, 但它记录到的影像都一样, 7 gB{In0  
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照理来说调整DETECTOR角度的话干涉条文应该会一边粗一边细周期不一, P,bd'  
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但我这里无法看到, \Btk;ivg  
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请问该如何处理呢, |Y_ -  
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下面是程式 \)m"3yY  
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--------------------------------------------------------------- k5+]SG`]]  
SYSTEM NEW N~,_`=yRx  
RESET -pTI?  
6&2LWaWMo$  
UNITS CENTIMETERS ~tm0QrJn/  
WAVELENGTH 632.8 NANOMETERS INMP"1  
/c+)C"  
WL=632.8E-7 i+M*J#'  
PI=4*ATAN(1) :,*eX' fH  
Y9}8M27vQG  
COATING PROPERTIES :\V,k~asl  
  0.0  0.0  'ABSORB' m[2'd  
  0.0  1.0  'TRANSMIT' nJ3vi}`  
  1.0  0.0  'REFLECT' a5`eyL[f  
  0.5  0.5  'BEAM_SPLITTER' ;MTz]c  
2DMrMmLI  
PL=100  !! Path length {^RG% &S  
DIA=50  !! Diameter E;-qP)yU  
M$CVQ>op:  
SURFACE _GbE^  
  PLANE Z 0 ELLIPSE (DIA/2) (1.414*DIA/2) 0 0 0 ]O!s'lC  
  OBJECT 'PELLICLE' IKf`[_,t]  
    INTERFACE COATING "BEAM_SPLITTER" AIR AIR "xwM+AC  
    FACETS 4 4
q=Xg*PM,  
    REDEFINE COLOR 1 j|'R$|  
    ROTATE X 45 ! sYf<  
s'2Rs^,hN  
!! Retro Reflector 1 kHU"AD}.  
SURFACE ,hE/II`-d'  
  PLANE Z 0 ELLIPSE 2@(DIA/2) $U'3ME
Ew  
  OBJECT 'RETRO1_FRONT' {fG|_+tl3o  
    INTERFACE COAT REFLECT AIR SCHOTT_BK7 .Dv=pB,u  
    FACETS 4 4 VJ1*|r,  
    REDEFINE COLOR 1  ~u/@rqF  
    ROTATE X -90 Yk>8g;<  
    SHIFT Y (PL) BRtXf0~&p  
vw rRZ"2  
!! Retro Reflector 2 k&DGJ5m$.  
TILT_WAVES=2  !! Tilt in waves Oc-u=K,B  
TILT=(TILT_WAVES*WL/(DIA/2))*180/PI  !! Tilt in degrees H'Iq~Ft1  
)<LI%dQ:'l  
SURFACE %1jdiHTaL  
  PLANE Z 0 ELLIPSE 2@(30) g3a/;wl  
  OBJECT 'RETRO2_FRONT' [#X|+M&u6  
    INTERFACE COAT REFLECT AIR SCHOTT_BK7 i_YW;x  
    FACETS 4 4 $n*%v85  
    REDEFINE COLOR 1 o_:Qk;t  
    SHIFT Z (PL) zv9MHC &  
    ROTATE X (TILT) 5vGioO  
4.k`[q8  
!! DETECTOR z.59]\;U>  
SURFACE ruHrv"29  
  PLANE Z 0 RECT 2@(DIA) Z3n~&!  
  OBJECT 'DETECTOR' 5\?3$<1I  
    INTERFACE COAT ABSORB AIR SCHOTT_BK7 Xv*}1PZH  
    FACETS 4 4 CSH`pU  
    REDEFINE COLOR 1 . z].:$J&  
    ROTATE X 90 n>T:
2PQ3  
    !!ROTATE Z 45 7%tR&F -u  
    SHIFT Y -(PL) Z*h ;e;  
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^hCh-js  
!! Verify Geometry 0k.v0a7%  
WINDOW Y Z pDmK  
PLOT FACETS 7 7 OVERLAY DOT=U _  
Zr9d&|$  
!! Define source [lOf|^9  
PARABASAL 4 ~ ;XYwQ"  
BEAMS COHERENT DIFFRACT a.CF9m5]c  
WAVELENGTH 6328 ANGSTROMS T(&kXMaB  
WIDTHS 1.6 fo;6huz  
Vbo5`+NAis  
GRID ELLIPTIC Z -100 -4@(DIA/2) 2@11 fIH#  
  SOURCE DIRECTION Z 0 0 \{:%v#ZZ  
pIvfmIm  
TRACE PLOT COLOR 2 H)`@2~Y  
$VIEW J2'W =r_#  
^pN 5NwC5  
PIXELS 101 @kz!{g]Sn  
CONSIDER ONLY DETECTOR =hPG_4#  
SPREAD NORMAL [
u7 vY@  
WINDOW Z -2@(DIA/2) X -2@(DIA/2) B%2L1T=  
WINDOW 1.2  !! Enlarge by 20% P3i^S_  
SPREAD NORMAL p %L1uwLG  
Ma>:_0I5  
DISPLAY ^DzL$BX  
  PICTURE })KJ60B  
RETURN 5Yn{?r\#F