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要如何使用倾斜的detector看到不同周期的干涉条纹 ,77d(bR<
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这边有一个Michelson Interferometer, o&)8o5
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我试着调整DETECTOR的角度, 但它记录到的影像都一样, #:U%mHT(_
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照理来说调整DETECTOR角度的话干涉条文应该会一边粗一边细周期不一, x,@B(9No
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但我这里无法看到, S3*`jF>q
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请问该如何处理呢, d_E/8R_$L
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下面是程式 hPkWCoQpq
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SYSTEM NEW UapC"XYJ
RESET S8wLmd>
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UNITS CENTIMETERS ;oKZ!ND
WAVELENGTH 632.8 NANOMETERS Sc1 8dC0
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WL=632.8E-7 r|fL&dtr
PI=4*ATAN(1) (Ag16
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COATING PROPERTIES 0oZ=
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0.0 0.0 'ABSORB' +-U- D?-
0.0 1.0 'TRANSMIT' RYQR(v
1.0 0.0 'REFLECT' M2>Vj/
0.5 0.5 'BEAM_SPLITTER' =9boya,>
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PL=100 !! Path length *ebSq)
DIA=50 !! Diameter pnowy;
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SURFACE F^t DL:
PLANE Z 0 ELLIPSE (DIA/2) (1.414*DIA/2) 0 0 0 [P=Jw:E
OBJECT 'PELLICLE' vrhT<+q
INTERFACE COATING "BEAM_SPLITTER" AIR AIR gx8ouOh
FACETS 4 4 *yt=_Q
REDEFINE COLOR 1 rq/yD,I,
ROTATE X 45 :bu/^mW[
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!! Retro Reflector 1 L_uVL#To
SURFACE 7Oa#c<2]
PLANE Z 0 ELLIPSE 2@(DIA/2) ^& tZ
OBJECT 'RETRO1_FRONT' tqvN0vY5
INTERFACE COAT REFLECT AIR SCHOTT_BK7 "$Z= %.3Q
FACETS 4 4 7$vYo
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REDEFINE COLOR 1 Pw7]r<Q
ROTATE X -90 nQX:T;WL@
SHIFT Y (PL) q77;ZPfs8
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!! Retro Reflector 2 1EO7H{E=
TILT_WAVES=2 !! Tilt in waves 8>2.UrC
TILT=(TILT_WAVES*WL/(DIA/2))*180/PI !! Tilt in degrees b8`)y<