如果採用 Code V 軟體，那麼可以用 SAGF 函數計算面深(Sag)量： ]4yvTP3[Rm
SAGF(surface_num, zoom_pos, x_coord, y_coord) - Sag of the designated surface at x_coord, y_coord MocH>^,
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如果想知道的是某一非球面的型狀是否能由干涉儀測量，那麼 Code V 提供兩個函數: QhUr aZ
H-W) Tq_?-
(1) 使用 Zygo 干涉儀 ~}AP@t*
函數 @VFA(zoom #, surface #, height) Zy%Z]dF
Surface is testable for @VFA < 1.0 C] w< &o
Surface is not testable for @VFA > 1.0 h~@+M5r ,
GP$ Y4*y/
(2)使用 QED 干涉儀 OKVYpf
函數 @SSIa(surface #, zoom #, height) *PEuaRDN
0 <= @SSIa < 0.5 - surface is readily testable Q(6(Scp{
0.5 <= @SSIa < 1 - surface is marginally testable t["Df; "O
@SSIa >= 1 - surface is difficult to test
