Outline of the contents: i]qxF&1
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1. Basic Interferometers for Optical Testing IaO&f<^#o
2. Phase-Shifting Interferometry vCOtED*<
3. Specialized Optical Tests k6RH]Ha
4. Long Wavelength Interferometry .%M80X{5~
5. Testing of Aspheric Surfaces _C|j"f/}
6. Measurement of Surface Microstructure M+lr [,c
7. Absolute Measurements "2 :zWh7|
8. Concluding Remarks
