Outline of the contents: M8HHyV[AmC
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1. Basic Interferometers for Optical Testing /$NZj"#
2. Phase-Shifting Interferometry ]= nM|e
3. Specialized Optical Tests u|}p3-z|Y
4. Long Wavelength Interferometry B(TE?[ #
5. Testing of Aspheric Surfaces K~DQUmU@
6. Measurement of Surface Microstructure o,yP9~8\
7. Absolute Measurements SZ'2/#R>
8. Concluding Remarks