Outline of the contents: =$IjN v(?
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1. Basic Interferometers for Optical Testing 0*q&)
2. Phase-Shifting Interferometry LzS@@']
3. Specialized Optical Tests XU .FLNe
4. Long Wavelength Interferometry 8|`4D 'Ln
5. Testing of Aspheric Surfaces B`}?rp
6. Measurement of Surface Microstructure d:6?miMH]t
7. Absolute Measurements 1_!*R]a q
8. Concluding Remarks