Outline of the contents: "p.MJxH
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1. Basic Interferometers for Optical Testing 0`"]mYH
2. Phase-Shifting Interferometry {5-4^|!
3. Specialized Optical Tests pA"x4\s
4. Long Wavelength Interferometry T({:Y. A;
5. Testing of Aspheric Surfaces T9KzVxHp5
6. Measurement of Surface Microstructure ?;,s=2
7. Absolute Measurements h|yv*1/|
8. Concluding Remarks