Outline of the contents: %nS( >X<B
x/p X?k
1. Basic Interferometers for Optical Testing > `1K0?_
2. Phase-Shifting Interferometry -l Y,lC>{
3. Specialized Optical Tests -Qy@-s $
4. Long Wavelength Interferometry %jE0Z4\
5. Testing of Aspheric Surfaces 8|L U=p`y'
6. Measurement of Surface Microstructure xA'RO-a}h
7. Absolute Measurements 8aqH;|fG}
8. Concluding Remarks
