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题目：Solid-immersion imaging of a silicon flip-chip with a resolution of 325 nm using the optical-beam induced current method sef]>q  
作者：Ramsay, E.; Pleynet, N.; Xiao, D.; Warburton, R.J.; Reid, D.T. ];1R&:t  
期刊：Lasers and Electro-Optics, 2005. (CLEO). Conference on L_Q S0_1
 
Volume 1, Issue , 22-27 May 2005 Page(s): 663 - 665 Vol. 1 X3',vey  
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