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要如何使用倾斜的detector看到不同周期的干涉条纹 !7Nz_d~n
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这边有一个Michelson Interferometer, o8fY!C)
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我试着调整DETECTOR的角度, 但它记录到的影像都一样, ^wz 2e
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照理来说调整DETECTOR角度的话干涉条文应该会一边粗一边细周期不一, uLSuY}K0
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但我这里无法看到, w#{S=^`}
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请问该如何处理呢, aole`PD,l
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下面是程式 TNlOj a:
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--------------------------------------------------------------- 3<_=Vyf
SYSTEM NEW {!^0j{T
RESET ^/~C\
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UNITS CENTIMETERS ^Vg-fO]V
WAVELENGTH 632.8 NANOMETERS d fSj= 4
OM81$Xo=
WL=632.8E-7 v\D.j4%ij
PI=4*ATAN(1) a(lmm@;V<
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COATING PROPERTIES VcLzv{
0.0 0.0 'ABSORB' e'r-o~1eN
0.0 1.0 'TRANSMIT' a"^rOiXR{
1.0 0.0 'REFLECT' >1$Vh=\OI
0.5 0.5 'BEAM_SPLITTER' p#6tKY;N
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PL=100 !! Path length V/BU(`~i
DIA=50 !! Diameter avW33owb@
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SURFACE Bo8NY!
PLANE Z 0 ELLIPSE (DIA/2) (1.414*DIA/2) 0 0 0 NRazI_Z
OBJECT 'PELLICLE' K9ek
INTERFACE COATING "BEAM_SPLITTER" AIR AIR tgY/8&$M
FACETS 4 4 X'j9l4Ph7
REDEFINE COLOR 1 o8~<t]Ejw
ROTATE X 45 DB(!*6#?
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!! Retro Reflector 1 A45!hhf
SURFACE &Qq|
PLANE Z 0 ELLIPSE 2@(DIA/2) 4+MaV<!tU^
OBJECT 'RETRO1_FRONT' O]KQ]zN
INTERFACE COAT REFLECT AIR SCHOTT_BK7 b-Ru UfUn0
FACETS 4 4 cp6I]#X
REDEFINE COLOR 1 d6)+d9?<