Outline of the contents: p']{WLDj2
J9lG0
1. Basic Interferometers for Optical Testing 0](V@F"~
2. Phase-Shifting Interferometry Bs^p!4=
3. Specialized Optical Tests e)aH7Jj#
4. Long Wavelength Interferometry I$*LMzve
5. Testing of Aspheric Surfaces \ \g Aa-}:
6. Measurement of Surface Microstructure .Zr3!N.t
7. Absolute Measurements R{q<V uN
8. Concluding Remarks