| 谈谈光电子 |
2014-11-15 19:16 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 ?HF%(>M
单光栅（标准配置）可覆盖5-80nm测量范围 Dn&D!B
技术参数 9I}-[|`u
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技术优势介绍： 7S}_F^
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see 3B84^>U<
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. HMSO=)@+
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the G"h'_7
same ratio. vX/T3WV
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. L DP UD'
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- Flat-field imaging technology #qK:J;Sn3
Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. jPUwSIP
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- Compactness / Modularity )h7<?@wv&
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. vSEuk}pk
There are no externally moving parts. ?l9XAW t\
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum 4 o Fel.o
pumping, etc). This makes it highly flexible for varying requirements and experiments. o]4*|ARPs
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- Robust against misalignment sB7#
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The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, .+$ Q <L
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and 8WXQ Oo8
allow for monitoring of the grating alignment at all times. :tV*7S=)
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical 3}}38A|4
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a [_k1jHr48N
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. yD zc<p\`
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- Customization 4h|c<-`>t
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every ;r<^a6B
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the Ayxkv)%:@)
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting *\
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situations, etc. !2%HhiB'
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典型客户： Te"ioU?.
1） 苏黎世联邦理工学院 p{r}?a
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) >;e~ WF>+K
3） MPQ "~sW"n(F_
4） Los Alamos Cd#(X@n
5） Max Planck Institute d; boIP`M;
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上海达灿光电科技有限公司
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021-60450828 o#3 ly-ht
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