| 谈谈光电子 |
2014-11-15 19:16 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 qhc3 oRe
单光栅（标准配置）可覆盖5-80nm测量范围 D3N\$ D
技术参数 sTv;Ogs.
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技术优势介绍： ?Zu2=<DU
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see JO{Rt h
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. M@%$9N)gd
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the `t Z m
same ratio. M*6}# ST
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. FyY<Vx'yQ
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- Flat-field imaging technology KVQ|l,E,
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Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. <O+T 4.z
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- Compactness / Modularity %+0
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The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. e ! BablG[
There are no externally moving parts. 4K{<R!2 I
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum JWzN 'a R
pumping, etc). This makes it highly flexible for varying requirements and experiments. Y;n;7M<F
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- Robust against misalignment C5k\RS9
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, l.gt+e
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and SY &)?~C
allow for monitoring of the grating alignment at all times. ,j^ z];
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical ?2LRMh")$
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a fiG/ "/u
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. %z9eVkPI~
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- Customization GB MCw
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every `*Ar6
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the WJ D1U?`
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting 3"9'MDKH
situations, etc. JrZ"AId2
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典型客户： 35>VCjCw0
1） 苏黎世联邦理工学院 BM6 J
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) H#zsk*=QD
3） MPQ ~_|OGp_a
4） Los Alamos ^dc~hD
5） Max Planck Institute "j(?fVx
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上海达灿光电科技有限公司 mI; #Zq_j
021-60450828 [ vWcQ6m
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