| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 ~0V ,B1a
单光栅（标准配置）可覆盖5-80nm测量范围 (|dN6M-.K
技术参数 dFzlcKFFD
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技术优势介绍： <~iA{sY)O
- Direct imaging of the source / Superior signal strength
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In contrast to conventional devices our XUV spectrometer does not 57rH`UF XH
require a narrow entrance aperture but rather images the harmonic source lQl
directly onto the detector. Thus 80% or more of the incoming beam can be Wer.VL
used for measurement. Please see _28vf Bl?
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. ZE 4xF8
This configuration typically collects 15 to 25 times more light than , %U'>F?
standard versions, resulting in a signal-to-noise figure improved by the ~]C m
same ratio. }1?
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In some experiments, this improved signal strength is the crucial step e!p?~70
for realizing a measurement at all. %bZ}vJ5b
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- Flat-field imaging technology -eQ70BXvB
Our instruments are based on high quality aberration-corrected ]x^v;r~
flat-field gratings. In contrast to conventional gratings these focus +kZW:t!-
all wavelengths onto a plane rather than a circle. This allows for sY@x(qkIOc
positioning the entire detector in the focal plane of the grating for u
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superior spectral resolution. D&nVkZP>
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- Compactness / Modularity $^louas&
The spectrometer is very compact and can be bolted directly to a vacuum ^gd[U C-"w
chamber. It is capable of carrying its own weight, no table required. Qv/Kb w
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There are no externally moving parts. \zv?r :1t
Through its modular design, our spectrometer can be adapted to a number [RFF&uy
of configurations (source distance, spectral range, detectors, vacuum _H)>U[
pumping, etc). This makes it highly flexible for varying requirements jb lj]/
and experiments. @`H47@e
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- Robust against misalignment .vk|aIG
The compact design of the spectrometer makes it inherently insensitive Dfl%Knl@J
against mechanical and environmental disturbances (vibrations, 5$Da\?Fpn
acoustics, etc). No externally moving parts and closed-loop grating 0z r Zrl
actuators with absolute position monitoring add to the robustness and .wJv_
allow for monitoring of the grating alignment at all times. 6ujePi <U
In addition, the concept of a spectrometer without entrance slit also i2Cw#x0s
makes the instrument less sensitive to misalignment. Under typical Nlk'
operating conditions a misalignment of the beam in the dispersion 1Aw/-FxJ
direction on the entrance of the spectrometer by 500um would lead to a VmTPE5d
signal reduction by more than 20% in an instrument with entrance slit ?JI:>3e
while it is less than 10% for our design. :Miri_l
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- Customization 18];fC
The adaptability of our XUV spectrometer makes it possible to highly PA <<{\dp
custom-fit the device to requirements. Thus we offer to customize every cr"AK"TQ
spectrometer to exactly match the desired research application. This 9~6)u=4sS"
includes e.g. interfacing to experimental chambers, adaption of the b@m\ca
source distance, integration of customer-supplied detectors, 1G I/ gc\
user-defined filter mounts, non-magnetic instruments, special mounting p 7eRAQ\'
situations, etc. _5JwJcQ
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典型客户： 3gNVnmZG
1） 苏黎世联邦理工学院 ` D9AtN] R
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) l4sm AT
3） MPQ 'v:%} qMv
4） Los Alamos 0tyS=X;#e
5） Max Planck Institute \g<=n&S?
上海达灿光电科技有限公司 Q l.abU
021-60450828
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