| 谈谈光电子 |
2014-11-02 18:37 |
XUV光谱仪
XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 :] Wn26z)
单光栅（标准配置）可覆盖5-80nm测量范围 +@$VJM%^7b
技术参数 xR'd}>`
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技术优势介绍： q q^[(n
- Direct imaging of the source / Superior signal strength WnQ'I=E#~
In contrast to conventional devices our XUV spectrometer does not : Q,O:
require a narrow entrance aperture but rather images the harmonic source | rpMwkR
directly onto the detector. Thus 80% or more of the incoming beam can be P^ -x
used for measurement. Please see 11$v~<M
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. x ZAg
This configuration typically collects 15 to 25 times more light than a$"Z \F:x
standard versions, resulting in a signal-to-noise figure improved by the PVKq&Q?
same ratio. ?#5)TAW
In some experiments, this improved signal strength is the crucial step $
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for realizing a measurement at all. cP21x<n
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- Flat-field imaging technology X7aj/:fXe
Our instruments are based on high quality aberration-corrected Yk4ah$}%-^
flat-field gratings. In contrast to conventional gratings these focus RXPl~]k#i
all wavelengths onto a plane rather than a circle. This allows for Xp^>SSt:4
positioning the entire detector in the focal plane of the grating for )sEAP Ika
superior spectral resolution. y9:o]; /
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- Compactness / Modularity <
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The spectrometer is very compact and can be bolted directly to a vacuum [o'}R`5)
chamber. It is capable of carrying its own weight, no table required. or` "{wop
There are no externally moving parts. %MfT5*||f
Through its modular design, our spectrometer can be adapted to a number ^w
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of configurations (source distance, spectral range, detectors, vacuum YkV-]%c
pumping, etc). This makes it highly flexible for varying requirements {.,y v>%
and experiments. =66, $~g{
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- Robust against misalignment { *|$@%y!
The compact design of the spectrometer makes it inherently insensitive atFu
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against mechanical and environmental disturbances (vibrations, X<"#=u(
acoustics, etc). No externally moving parts and closed-loop grating 4p&SlJ
actuators with absolute position monitoring add to the robustness and RG_)<U/B
allow for monitoring of the grating alignment at all times. H ~qY7t
In addition, the concept of a spectrometer without entrance slit also
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makes the instrument less sensitive to misalignment. Under typical r,Pu-bhF
operating conditions a misalignment of the beam in the dispersion y /?;s]>b
direction on the entrance of the spectrometer by 500um would lead to a an?g'8! r:
signal reduction by more than 20% in an instrument with entrance slit -E!V;Tgc%U
while it is less than 10% for our design. #KSB%
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- Customization E?f*Z {~,
The adaptability of our XUV spectrometer makes it possible to highly @}N;C ..Y$
custom-fit the device to requirements. Thus we offer to customize every ! FnH ;
spectrometer to exactly match the desired research application. This 1<9m^9_ro
includes e.g. interfacing to experimental chambers, adaption of the fm% Y*<Y"
source distance, integration of customer-supplied detectors, j#XU\G
user-defined filter mounts, non-magnetic instruments, special mounting {Q~A;t
situations, etc. HaamLu
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典型客户： <$;fOp
1） 苏黎世联邦理工学院 esEOV$s}
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) D&)gcO`\
3） MPQ Ol@
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4） Los Alamos M *c`@\
5） Max Planck Institute 7"
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上海达灿光电科技有限公司 >&9Iy"
021-60450828
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