XUV光谱仪

XUV光谱仪是新型的像差校正平场入射X射线光谱仪，光谱范围可涵盖1-80nm.模块化设计，可以满足不同的实验条件和环境。 j-W$)c3X  
    单光栅（标准配置）可覆盖5-80nm测量范围
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技术参数

G2)F<Y   波长范围	,_Bn{T=U   5-20	L\:m)g,F.   10-60	Ui`{U   25-80
?X@[ibH6   光源距离（m）	'5De1K.\`	AJxN9[Z!N   0.4-0.6	F}ATY!   0.5-1.5
_lwKa,}   平场尺寸（mm）	bS r"k   25.4	6AG]7d<   50	ng!cK<p   50
KGg S"d   色散(nm/mm)	h%ys::\zF   0.5-0.7	YRX^fZ-b   0.7-1.1	Babzrt-   0.9-1.3
M-Efe_VRQc   光谱分辨率（nm）	_G/R;N71   0.06	76)"uqv1x   0.09	cOX)+53   0.11
	$sda'L5^p   0.02（CCD探测器）
TZt;-t`   升级波长范围	T:X *   可拓展至1-5nm(搭配该范围光栅)
;'8P/a$   探测器选择	uH%b rbrU   X-Ray 相机，MCP探测器，fiber taper系统
hQm=9gS   光栅台	*$fM}6}   电控
s.i9&1Y-!   工作环境	nsU7cLf"^V   <10-6mbar
aO&{.DO2   操作性	8^y=YUT   极易安装使用，用户自己即可安装使用

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技术优势介绍： ~^Cx->l  
- Direct imaging of the source / Superior signal strength In contrast to conventional devices our XUV spectrometer does not require a narrow entrance aperture but rather images the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. Please see bXF8V  
http://www.hoerlein-partner.com/#!services/cihc for a sketch drawing. Kgr<OL}VJ  
This configuration typically collects 15 to 25 times more light than standard versions, resulting in a signal-to-noise figure improved by the ZY`9  
same ratio. q| 1%G Nb  
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all. -EP1Rl`\  
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- Flat-field imaging technology )2?]c  
Our instruments are based on high quality aberration-corrected flat-field gratings. In contrast to conventional gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire detector in the focal plane of the grating for superior spectral resolution. scH61Y8`  
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- Compactness / Modularity sT2`y$'  
The spectrometer is very compact and can be bolted directly to a vacuum chamber. It is capable of carrying its own weight, no table required. 8p%0d`sX  
There are no externally moving parts. %"Um8`]FVg  
Through its modular design, our spectrometer can be adapted to a number of configurations (source distance, spectral range, detectors, vacuum >ceC8"}J5M  
pumping, etc). This makes it highly flexible for varying requirements and experiments. zl:by?  
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- Robust against misalignment n~ad#iN  
The compact design of the spectrometer makes it inherently insensitive against mechanical and environmental disturbances (vibrations, q=5aHH% |  
acoustics, etc). No externally moving parts and closed-loop grating actuators with absolute position monitoring add to the robustness and 5tbCx!tL  
allow for monitoring of the grating alignment at all times. `KA==;0  
In addition, the concept of a spectrometer without entrance slit also makes the instrument less sensitive to misalignment. Under typical M^:JhX{  
operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer by 500um would lead to a ?m]vk|>  
signal reduction by more than 20% in an instrument with entrance slit while it is less than 10% for our design. ojnO69v  
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- Customization by @qg:  
The adaptability of our XUV spectrometer makes it possible to highly custom-fit the device to requirements. Thus we offer to customize every q=88*Y  
spectrometer to exactly match the desired research application. This includes e.g. interfacing to experimental chambers, adaption of the 6I"KomJ9  
source distance, integration of customer-supplied detectors, user-defined filter mounts, non-magnetic instruments, special mounting p]RQ-0  
situations, etc. erEB4q+ #O  
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典型客户： @`L;_S+  
1） 苏黎世联邦理工学院 [E a{);  
2） The Institute of Electronic Structure and Laser of the Foundation for Research and Technology-Hellas (IESL-FORTH) IsI5c  
3） MPQ jSE)&K4nI  
4） Los Alamos 3(V0
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5） Max Planck Institute ZDmL?mC  
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上海达灿光电科技有限公司 QNx]8r  
021-60450828 UVD D)